Seidleck, C.M.: search on Z-Library

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1

Proton-induced transients in optocouplers: in-flight anomalies, ground irradiation test, mitigation and implications

LaBel, K.A., Marshall, P.W., Marshall, C.J., D'Ordine, M., Carts, M., Lum, G., Kim, H.S., Seidleck, C.M., Powell, T., Abbott, R., Barth, J., Stassinopoulos, E.G.

Journal:

IEEE Transactions on Nuclear Science

Year:

1997

Language:

english

File:

PDF, 773 KB

english, 1997

2

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

Chen, Dakai, Wilcox, Edward, Ladbury, Raymond L., Seidleck, Christina, Kim, Hak, Phan, Anthony, LaBel, Kenneth A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2018

Language:

english

File:

PDF, 2.53 MB

english, 2018

3

Use of Commercial FPGA-Based Evaluation Boards for Single-Event Testing of DDR2 and DDR3 SDRAMs

Ladbury, R. L., Berg, M. D., Wilcox, E. P., LaBel, K. A., Kim, H. S., Phan, A. M., Seidleck, C. M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 2.53 MB

english, 2013

4

[IEEE IEEE Radiation Effects Data Workshop, 2005. - Seattle, WA, USA (11-15 July 2005)] IEEE Radiation Effects Data Workshop, 2005. - Validation and testing of design hardening for single event effects using the 8051 microcontroller

Howard, J.W., LaBel, K.A., Carts, M.A., Seidleck, C., Gambles, J.W., Ruggles, S.L.

Year:

2005

Language:

english

File:

PDF, 718 KB

english, 2005

5

[IEEE 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference - Newport Beach, CA, USA (24 July 1998)] 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385) - Single event effect and radiation damage results for candidate spacecraft electronics

O'Bryan, M.V., LaBel, K.A., Reed, R.A., Barth, J.L., Seidleck, C.M., Marshall, P., Marshall, C., Carts, M.

Year:

1998

Language:

english

File:

PDF, 896 KB

english, 1998

6

[IEEE 2016 IEEE Aerospace Conference - Big Sky, MT, USA (2016.3.5-2016.3.12)] 2016 IEEE Aerospace Conference - Developing forward-looking metrics to interpret SPI and CPI performance indices for GSFC projects

Seidleck, Mark, Reynolds, Scott, Krygiel, Joseph

Year:

2016

Language:

english

File:

PDF, 547 KB

english, 2016

7

[IEEE 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) - Madison, WI, USA (17-21 July 1995)] Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95) - Single event effect proton and heavy ion test results in support of candidate NASA programs

LaBel, K., Moran, A., Hawkins, D., Sanders, A., Seidleck, C., Kim, H., Fomey, J., Stassinopoulos, E.G., Marshall, P., Dale, C., Barry, R.

Year:

1995

Language:

english

File:

PDF, 1.07 MB

english, 1995

8

[IEEE 2006 IEEE Radiation Effects Data Workshop - Ponte Vedra Beach, FL, USA (2006.07.17-2006.07.21)] 2006 IEEE Radiation Effects Data Workshop - Radiation Characteristics of a 0.11¿m Modified Commercial CMOS Process

Poivey, Christian, Kim, Hak, Berg, Melanie, Forney, Jim, Seidleck, Christina, Vilchis, Miguel, Phan, Anthony, Irwin, Tim, LaBel, Kenneth, Saigusa, Rajan, Mirabedini, Mohammad, Finlinson, Rick, Suvkhan

Year:

2006

Language:

english

File:

PDF, 4.01 MB

english, 2006

9

[IEEE RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Cannes, France (15-19 Sept. 1997)] RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294) - Comparison of MIL-STD-1773 fiber optic data bus terminals: Single event proton test irradiation, in-flight space performance, and prediction techniques

LaBel, K.A., Marshall, P.W., Marshall, C.J., Barth, J., Leidecker, H., Reed, R., Seidleck, C.M.

Year:

1998

Language:

english

File:

PDF, 614 KB

english, 1998

10

[IEEE Workshop Record. 1994 IEEE Radiation Effects Data Workshop - Tucson, AZ, USA (20 July 1994)] Workshop Record. 1994 IEEE Radiation Effects Data Workshop - Single event effect proton and heavy ion test results for candidate spacecraft electronics

LaBel, K.A., Moran, A.K., Hawkins, D.K., Cooley, J.A., Seidleck, C.M., Gates, M.M., Smith, B.S., Stassinopoulos, E.G., Marshall, P., Dale, C.

Year:

1994

Language:

english

File:

PDF, 513 KB

english, 1994

11

Comparison of MIL-STD-1773 fiber optic data bus terminals: single event proton test irradiation, in-flight space performance, and prediction techniques

LaBel, K.A., Marshall, P.W., Marshall, C.J., Barth, J., Leidecker, H., Reed, R., Seidleck, C.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1998

Language:

english

File:

PDF, 632 KB

english, 1998

12

[IEEE 2003 IEEE Radiation Effects Data Workshop - Monterey, CA, USA (21-25 July 2003)] 2003 IEEE Radiation Effects Data Workshop - Single event effects results for candidate spacecraft electronics for NASA

O'Bryan, M.V., LaBel, K.A., Howard, J.W., Poivey, C., Ladbury, R.L., Kniffin, S.D., Buchner, S.P., Xapsos, M., Reed, R.A., Sanders, A.B., Seidleck, C.M., Marshall, C.J., Marshall, P.W., Titus, J., McM

Year:

2003

Language:

english

File:

PDF, 1001 KB

english, 2003

13

Enhancing Observability of Signal Composition and Error Signatures During Dynamic SEE Analog to Digital Device Testing

Berg, Melanie D., Buchner, Stephen P., Kim, Hak, Friendlich, Mark, Perez, Christopher, Phan, Anthony M., Seidleck, Christina M., Label, Kenneth A., Kruckmeyer, Kirby

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 748 KB

english, 2010

14

Single event effect testing of the Intel 80386 family and the 80486 microprocessor

Moran, A., LaBel, K., Gates, M., Seidleck, C., McGraw, R., Broida, M., Firer, J., Sprehn, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

1996

Language:

english

File:

PDF, 645 KB

english, 1996

15

A comparative study of heavy-ion and proton-induced bit-error sensitivity and complex burst-error modes in commercially available high-speed SiGe BiCMOS

Marshall, P., Carts, M., Campbell, A., Ladbury, R., Reed, R., Marshall, C., Currie, S., McMorrow, D., Buchner, S., Seidleck, C., Riggs, P., Fritz, K., Randall, B., Gilbert, B.

Journal:

IEEE Transactions on Nuclear Science

Year:

2004

Language:

english

File:

PDF, 245 KB

english, 2004

16

μ opiate receptor structure/function relationships III

CK Surratt, PS Johnson, A Moriwaki, BK Seidleck, CJ Blaschak, JB Wang, S Yuhasz, GR Uhl

Journal:

Regulatory Peptides

Year:

1994

Language:

english

File:

PDF, 160 KB

english, 1994

17

[IEEE 2018 IEEE Aerospace Conference - Big Sky, MT, USA (2018.3.3-2018.3.10)] 2018 IEEE Aerospace Conference - The ice, cloud, and land elevation satellite-2 — Overview, science, and applications

Year:

2018

Language:

english

File:

PDF, 680 KB

english, 2018

18

[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - SEE data from the APEX Cosmic Ray Upset Experiment: predicting the performance of commercial devices in space

Adolphsen, J., Barth, J.L., Stassinopoulos, E.G., Gruner, T., Wennersten, M., LaBel, K.A., Seidleck, C.M.

Year:

1996

Language:

english

File:

PDF, 1011 KB

english, 1996

19

[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - Single event effect testing of the Intel 80386 family and the 80486 microprocessor

Moran, A., LaBel, K., Gates, M., Seidleck, C., McGraw, R., Broida, M., Firer, J., Sprehn, S.

Year:

1996

Language:

english

File:

PDF, 624 KB

english, 1996

20

[IEEE 2000 IEEE Radiation Effects Data Workshop. Workshop Record - Reno, NV, USA (24-28 July 2000)] 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527) - Radiation damage and single event effect results for candidate spacecraft electronics

O'Bryan, M.V., LaBel, K.A., Reed, R.A., Howard, J.W., Ladbury, R.L., Barth, J.L., Kniffin, S.D., Seidleck, C.M., Marshall, P.W., Marshall, C.J., Kim, H.S., Hawkins, D.K., Sanders, A.B., Carts, M.A., F

Year:

2000

Language:

english

File:

PDF, 1.39 MB

english, 2000

21

SEE and TID Characterization of an Advanced Commercial 2Gbit NAND Flash Nonvolatile Memory

Oldham, T. R., Ladbury, R. L., Friendlich, M., Kim, H. S., Berg, M. D., Irwin, T. L., Seidleck, C., LaBel, K. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 172 KB

english, 2006

22

[IEEE 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record - Vancouver, BC, Canada (16-20 July 2001)] 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588) - Recent radiation damage and single event effect results for candidate spacecraft electronics

O'Bryan, M.V., LaBel, K.A., Reed, R.A., Ladbury, R.L., Howard, J.W., Buchner, S.P., Barth, J.L., Kniffin, S.D., Seidleck, C.M., Marshal, C.J., Marshal, P.W., Kim, H.S., Hawkins, D.K., Carts, M.A., For

Year:

2001

Language:

english

File:

PDF, 1.66 MB

english, 2001

23

Flash Memory

Oldham, Timothy R., Friendlich, M., Carts, M. A., Seidleck, C. M., LaBel, Kenneth A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2009

Language:

english

File:

PDF, 631 KB

english, 2009

24

Selection of Well Contact Densities for Latchup-Immune Minimal-Area ICs

Dodds, N. A., Hutson, J. M., Pellish, J. A., Reed, R. A., Kim, H. S., Berg, M. D., Friendlich, M. R., Phan, A. M., Seidleck, C. M., Xapsos, M. A., Deng, X., Baumann, R. C., Schrimpf, R. D., King, M. P

Journal:

IEEE Transactions on Nuclear Science

Year:

2010

Language:

english

File:

PDF, 450 KB

english, 2010

25

SEE data from the APEX Cosmic Ray Upset experiment: predicting the performance of commercial devices in space

Adolphsen, J., Barth, J.L., Stassinopoulos, E.G., Gruner, T., Wennersten, M., LaBel, K.A., Seidleck, C.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1996

Language:

english

File:

PDF, 958 KB

english, 1996

26

[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - Single event effect flight data analysis of multiple NASA spacecraft and experiments; implications to spacecraft electrical designs

Seidleck, C.M., LaBel, K.A., Moran, A.K., Gates, M.M., Barth, J.M., Stassinopoulos, E.G., Gruner, T.D.

Year:

1996

Language:

english

File:

PDF, 798 KB

english, 1996

27

SEU Error Signature Analysis of Gbit/s SiGe Logic Circuits Using a Pulsed Laser Microprobe

Sutton, Akil K., Krithivasan, Ramkumar, Marshall, Paul W., Carts, Martin A., Seidleck, Christina, Ladbury, Ray, Cressler, John D., Marshall, Cheryl J., Currie, Steve, Reed, Robert A., Niu, Guofu, Rand

Journal:

IEEE Transactions on Nuclear Science

Year:

2006

Language:

english

File:

PDF, 717 KB

english, 2006

28

Assessing the impact of the space radiation environment on parametric degradation and single-event transients in optocouplers

Reed, R.A., Poivey, C., Marshall, P.W., LaBel, K.A., Marshall, C.J., Kniffin, S., Barth, J.L., Seidleck, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2001

Language:

english

File:

PDF, 115 KB

english, 2001

29

SEU Analysis of Complex Circuits Implemented in Actel RTAX-S FPGA Devices

Berg, M., Kim, H., Friendlich, M., Perez, C., Seidleck, C., LaBel, K., Ladbury, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 1.10 MB

english, 2011

30

[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Enhancing observability of signal composition response and error signatures during dynamic SEE analog to digital device testing

Berg, M., Buchner, S., Kim, H., Friendlich, M., Perez, C., Phan, A., Seidleck, C., LaBel, K.

Year:

2009

Language:

english

File:

PDF, 295 KB

english, 2009

31

SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Photonics for Space Environments IV - Preliminary ground test radiation results of NASA's MPTB dual-rate 1773 experiment

LaBel, Kenneth A., Flanegan, Mark C., Jackson, George L., Hawkins, Donald K., Dale, Cheryl J., Marshall, Paul W., Johnson, Donald, Seidleck, Christina, Bonebright, Rodney K., Kim, Jae H., Chan, Eric Y

Year:

1996

Language:

english

File:

PDF, 301 KB

english, 1996

32

Evaluation of ADCI against convulsant and locomotor stimulant effects of cocaine: Comparison with structural analogs dizocilpine and carbamazepine

Brian K. Seidleck, Andrew Thurkauf, Jeffrey M. Witkin

Journal:

Pharmacology Biochemistry and Behavior

Year:

1994

Language:

english

File:

PDF, 629 KB

english, 1994

33

Implications of single event effect characterization of hybrid DC-DC converters and a solid state power controller

LaBel, K.A., Barry, R.K., Castell, K., Kim, H.S., Seidleck, C.M.

Journal:

IEEE Transactions on Nuclear Science

Year:

1995

Language:

english

File:

PDF, 589 KB

english, 1995

34

Effect of Radiation Exposure on the Retention of Commercial NAND Flash Memory

Oldham, T. R., Chen, D., Friendlich, M., Carts, M. A., Seidleck, C. M., LaBel, K. A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 834 KB

english, 2011

35

[IEEE 1998 IEEE Aerospace Conference. Proceedings - Snowmass at Aspen, CO, USA (21-28 March 1998)] 1998 IEEE Aerospace Conference Proceedings (Cat. No.98TH8339) - On the suitability of fiber optic data links in the space radiation environment: a historical and scaling technology perspective

LaBel, K.A., Marshall, C.J., Marshall, P.W., Luers, P.J., Reed, R.A., Ott, M.N., Seidleck, C.M., Andrucyk, D.J.

Year:

1998

Language:

english

File:

PDF, 1.52 MB

english, 1998

36

[IEEE 2008 IEEE Radiation Effects Data Workshop - Tucson, AZ (2008.07.14-2008.07.18)] 2008 IEEE Radiation Effects Data Workshop - TID and SEE Response of Advanced 4G NAND Flash Memories

Oldham, T. R., Suhail, M., Friendlich, M. R., Carts, M. A., Ladbury, R. L., Kim, H. S., Berg, M. D., Poivey, C., Buchner, S. P., Sanders, A. B., Seidleck, C. M., LaBel, K. A.

Year:

2008

Language:

english

File:

PDF, 1.17 MB

english, 2008

37

Complex SEU signatures in high-speed analog-to-digital conversion

Heidergott, W.F., Ladbury, R., Marshall, P.W., Buchner, S., Campbell, A.B., Reed, R.A., Hockmuth, J., Kha, N., Seidleck, C., Assad, A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2001

Language:

english

File:

PDF, 81 KB

english, 2001

38

Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets in a NAND Flash Memory

Chen, Dakai, Wilcox, Edward, Ladbury, Ray, Kim, Hak, Phan, Anthony, Seidleck, Christina, LaBel, Kenneth

Journal:

IEEE Transactions on Nuclear Science

Year:

2016

Language:

english

File:

PDF, 751 KB

english, 2016

39

[IEEE 2004 IEEE Radiation Effects Data Workshop - Atlanta, GA, USA (22 July 2004)] 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774) - Current single event effects results for candidate spacecraft electronics for NASA

O'Bryan, M.V., Seidleck, C.M., Carts, M.A., Howard, J.W., Kim, H.S., Forney, J.D., Label, K.A., Marshall, C.J., Reed, R.A., Sanders, A.B., Hawkins, D.K., Cox, S.R., Buchner, S.P., Oldham, T.R., Sutton

Year:

2004

Language:

english

File:

PDF, 2.81 MB

english, 2004

40

[IEEE 2011 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2011) - Las Vegas, NV, USA (2011.07.25-2011.07.29)] 2011 IEEE Radiation Effects Data Workshop - Investigation of Current Spike Phenomena during Heavy Ion Irradiation of NAND Flash Memories

Oldham, Timothy R., Berg, Melanie, Friendlich, Mark, Wilcox, Ted, Seidleck, Christina, LaBel, Kenneth A., Irom, Farokh, Buchner, Steven P., McMorrow, Dale, Mavis, David G., Eaton, Paul H., Castillo, J

Year:

2010

Language:

english

File:

PDF, 4.24 MB

english, 2010

41

Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM

Heidel, David F., Marshall, Paul W., LaBel, Kenneth A., Schwank, James R., Rodbell, Kenneth P., Hakey, Mark C., Berg, Melanie D., Dodd, Paul E., Friendlich, Mark R., Phan, Anthony D., Seidleck, Christ

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 565 KB

english, 2008

42

Device-Orientation Effects on Multiple-Bit Upset in 65 nm SRAMs

Tipton, Alan D., Pellish, Jonathan A., Hutson, John M., Baumann, Robert, Deng, Xiaowei, Marshall, Andrew, Xapsos, Michael A., Kim, Hak S., Friendlich, Mark R., Campola, Michael J., Seidleck, Christina

Journal:

IEEE Transactions on Nuclear Science

Year:

2008

Language:

english

File:

PDF, 538 KB

english, 2008

43

[IEEE 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 - Fontevraud, France (13-17 Sept. 1999)] 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) - Single event upsets in the dual-port-board SRAMs of the MPTB experiment

Barak, J., Barth, J.L., Seidleck, C.M., Marshall, C.J., Marshall, P.W., Carts, M.A., Reed, R.A.

Year:

2000

Language:

english

File:

PDF, 559 KB

english, 2000

44

[IEEE 2009 IEEE Aerospace conference - Big Sky, MT, USA (2009.03.7-2009.03.14)] 2009 IEEE Aerospace conference - The Fermi Gamma-Ray Space Telescope: Overview and early science results

Leibee, Jack, Seidleck, Mark, McEnery, Julie

Year:

2009

Language:

english

File:

PDF, 1.74 MB

english, 2009

45

Mutation of human μ opioid receptor extracellular “disulfide cysteine” residues alters ligand binding but does not prevent receptor targeting to the cell plasma membrane

Peisu Zhang, Peter S Johnson, Christian Zöllner, Wenfei Wang, Zaijie Wang, Anita E Montes, Brian K Seidleck, Carrie J Blaschak, Christopher K Surratt

Journal:

Molecular Brain Research

Year:

1999

Language:

english

File:

PDF, 1.32 MB

english, 1999

46

[IEEE 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference - Norfolk, VA, USA (12-16 July 1999)] 1999 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.99TH8463) - Recent radiation damage and single event effect results for microelectronics

O'Bryan, M.V., LaBel, K.A., Reed, R.A., Howard, J.W., Barth, J.L., Seidleck, C.M., Marshall, P.W., Marshall, C.J., Kim, H.S., Hawkins, D.K., Carts, M.A., Forslund, K.E.

Year:

1999

Language:

english

File:

PDF, 1.06 MB

english, 1999

47

[IEEE 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference - Indian Wells, CA, USA (19 July 1996)] 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference - Current single event effect test results for candidate spacecraft electronics

LaBel, K.A., Moran, A.K., Hawkins, D.K., Sanders, A.B., Seidleck, C.M., Kim, H.S., Forney, J.E., Stassinopoulos, E.G., Marshall, P., Dale, C., Kinnison, J., Carkhuff, B.

Year:

1996

Language:

english

File:

PDF, 751 KB

english, 1996

48

Single-Event Effect Performance of a Conductive-Bridge Memory EEPROM

Chen, Dakai, Wilcox, Edward, Berg, Melanie, Kim, Hak, Phan, Anthony, Figueiredo, Marco, Seidleck, Christina, LaBel, Kenneth

Journal:

IEEE Transactions on Nuclear Science

Year:

2015

Language:

english

File:

PDF, 1.45 MB

english, 2015

49

[IEEE 2009 IEEE Radiation Effects Data Workshop (in Conjunction with NSREC 2009) - Quebec, Canada (2009.07.20-2009.07.24)] 2009 IEEE Radiation Effects Data Workshop - TID and SEE Response of Advanced Samsung and Micron 4G NAND Flash Memories for the NASA MMS Mission

Oldham, T. R., Friendlich, M. R., Sanders, A. B., Seidleck, C. M., Kim, H. S., Berg, M. D., LaBel, K. A.

Year:

2009

Language:

english

File:

PDF, 2.46 MB

english, 2009

50

Single event upsets in the dual-port-board SRAMs of the MPTB experiment

Barak, J., Barth, J.L., Seidleck, C.M., Marshall, C.J., Marshall, P.W., Carts, M.A., Reed, R.A.

Journal:

IEEE Transactions on Nuclear Science

Year:

2000

Language:

english

File:

PDF, 410 KB

english, 2000

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